1. SECOND CYCLE - MASTER'S DEGREE
  2. THE GRADUATE SCHOOL OF NATURAL AND APPLIED SCIENCES
  3. ADVANCED TECHNOLOGIES DEPARTMENT
  4. 1247 ADVANCED TECHNOLOGIES
Course Information Course Learning Outcomes Course's Contribution To Program ECTS Workload Course Details
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COURSE INFORMATION
Course CodeCourse TitleL+P HourSemesterECTS
ILT 536ELECTRON MICROSCOPY AND EXAMINATION METHODS3 + 02nd Semester7,5

COURSE DESCRIPTION
Course Level Master's Degree
Course Type Elective
Course Objective Students taking this course will be able to learn the differences between electron microscopy and light microscopy and the types of electron microscopes, know the TEM and SEM image formation mechanisms, and understand the steps required to take images and examine them with each electron microscope.
Course Content Types of electron microscopes and their comparison with light microscopy, their use in science, health and engineering fields, examination of biological and non-biological materials and the process steps in their examination, TEM, SEM, image formation mechanism in TEM, image formation mechanism in SEM, buffers used in electron microscopy , fixatives, embedding materials and dyes, preparation for TEM, embedding, taking of thick and thin sections, contrasting and image analysis in TEM, preparation for SEM, critical point drying and coating and image analysis in SEM.
Prerequisites No the prerequisite of lesson.
Corequisite No the corequisite of lesson.
Mode of Delivery Face to Face

COURSE LEARNING OUTCOMES
1Knows and compares electron microscope and light microscope.
2Knows how to examine biological and non-biological materials and the process steps applied.
3Knows the image formation mechanisms in TEM.
4Knows the image formation mechanisms in SEM.
5Can analyze the image obtained in TEM and SEM.

COURSE'S CONTRIBUTION TO PROGRAM
PO 01PO 02PO 03PO 04PO 05PO 06PO 07PO 08PO 09PO 10PO 11PO 12
LO 001            
LO 002            
LO 003            
LO 004            
LO 005            
Sub Total            
Contribution000000000000

ECTS ALLOCATED BASED ON STUDENT WORKLOAD BY THE COURSE DESCRIPTION
ActivitiesQuantityDuration (Hour)Total Work Load (Hour)
Course Duration (14 weeks/theoric+practical)14342
Hours for off-the-classroom study (Pre-study, practice)14798
Assignments12828
Mid-terms11212
Final examination11515
Total Work Load

ECTS Credit of the Course





195

7,5
COURSE DETAILS
 Select Year   


 Course TermNoInstructors
Details 2023-2024 Spring1FİKRET SARI


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Course Details
Course Code Course Title L+P Hour Course Code Language Of Instruction Course Semester
ILT 536 ELECTRON MICROSCOPY AND EXAMINATION METHODS 3 + 0 1 Turkish 2023-2024 Spring
Course Coordinator  E-Mail  Phone Number  Course Location Attendance
Assoc. Prof. Dr. FİKRET SARI fsari@pau.edu.tr DTMYO A0013 %70
Goals Students taking this course will be able to learn the differences between electron microscopy and light microscopy and the types of electron microscopes, know the TEM and SEM image formation mechanisms, and understand the steps required to take images and examine them with each electron microscope.
Content Types of electron microscopes and their comparison with light microscopy, their use in science, health and engineering fields, examination of biological and non-biological materials and the process steps in their examination, TEM, SEM, image formation mechanism in TEM, image formation mechanism in SEM, buffers used in electron microscopy , fixatives, embedding materials and dyes, preparation for TEM, embedding, taking of thick and thin sections, contrasting and image analysis in TEM, preparation for SEM, critical point drying and coating and image analysis in SEM.
Topics
WeeksTopics
1 Types of microscope today
2 History of electron microscopy and comparison with light microscopy
3 Types of electron microscope
4 Image formation mechanism in transmission electron microscope (TEM)
5 Image formation mechanism in scanning electron microscope (TEM)
6 Buffers, fixatives, embedding materials and dyes used in electron microscopy
7 Preparation for TEM
8 Preparing semi- and ultra-thin sections using ultramicrotome
9 Coating of grids and contrasting
10 Image analysis in TEM
11 Preparation for SEM
12 Critical point drying and coating
13 Image analysis in SEM
14 Energy dispersive X-ray spectroscopy (EDS) in SEM
Materials
Materials are not specified.
Resources
Course Assessment
Assesment MethodsPercentage (%)Assesment Methods Title
Final Exam50Final Exam
Midterm Exam50Midterm Exam
L+P: Lecture and Practice
PQ: Program Learning Outcomes
LO: Course Learning Outcomes